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Home | Events Archive | ARIP: An Additive Random Item Parameter Model for Binary and Ordered-Category Data, with Random Induction and Random Sensitivity Parameters
Seminar

ARIP: An Additive Random Item Parameter Model for Binary and Ordered-Category Data, with Random Induction and Random Sensitivity Parameters


  • Series
    Array
  • Speaker
    Paul de Boeck (University of Amsterdam)
  • Field
    Econometrics
  • Location
    Rotterdam
  • Date and time

    December 03, 2009
    00:00